Semiconductor Materials(Wafer)
Analysis of wafer contamination necessary for foundry processes.
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Display Materials
Analysis of organic films on glass substrates.
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Metals and Steel Materials
Quantitative and qualitative analysis of hydrogen embrittlement.
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Standard Reference Material (NIST)
Hydrogen (Nominal Mass Fraction 125 mg/kg H)
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TDS Analysis Request Form
Upon completion, please send the email to master@ivt4u.com.
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