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TDS

TDS Sample Data

Semiconductor Materials(Wafer)

Analysis of wafer contamination necessary for foundry processes.


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Display Materials

Analysis of organic films on glass substrates.


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Metals and Steel Materials

Quantitative and qualitative analysis of hydrogen embrittlement.


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Standard Reference Material (NIST)

Hydrogen (Nominal Mass Fraction 125 mg/kg H)


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TDS Analysis Request Form

Upon completion, please send the email to master@ivt4u.com.


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